Which type of memory chip can be erased only when it is removed from the computer and exposed to a special type of ultraviolet light?

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Which type of memory chip can be erased only when it is removed from the computer and exposed to a special type of ultraviolet light?

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The correct answer is EPROM.

Which type of memory chip can be erased only when it is removed from the computer and exposed to a special type of ultraviolet light?
Key Points

  • EPROM
    • An EPROM (rarely EROM), or erasable programmable read-only memory, is a type of programmable read-only memory (PROM) chip that retains its data when its power supply is switched off.
    • Computer memory that can retrieve stored data after a power supply has been turned off and back on is called non-volatile.
    • It is an array of floating-gate transistors individually programmed by an electronic device that supplies higher voltages than those normally used in digital circuits.
    • Once programmed, an EPROM can be erased by exposing it to a strong ultraviolet light source (such as from a mercury-vapour lamp).
    • EPROMs are easily recognizable by the transparent fused quartz window on the top of the package, through which the silicon chip is visible, and which permits exposure to ultraviolet light during erasing.

Which type of memory chip can be erased only when it is removed from the computer and exposed to a special type of ultraviolet light?
Additional Information 

  • DRAM
    • Dynamic random access memory (DRAM) is a type of semiconductor memory that is typically used for the data or program code needed by a computer processor to function.
    • DRAM is a common type of random access memory (RAM) that is used in personal computers (PCs), workstations, and servers.
  • EEPROM
    • EEPROM (electrically erasable programmable read-only memory) is a user-modifiable read-only memory (ROM) that can be erased and reprogrammed (written to) repeatedly through the application of higher than normal electrical voltage.
    • Unlike EPROM chips, EEPROMs do not need to be removed from the computer to be modified.
    • However, an EEPROM chip has to be erased and reprogrammed in its entirety, not selectively.
  • PROM
    • A programmable read-only memory is a form of digital memory where the setting of each bit is locked by a fuse or anti-fuse.
    • It is one type of read-only memory.
    • The data in them are permanent and cannot be changed.

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Which type of memory chip can be erased only when it is removed from the computer and exposed to a special type of ultraviolet light?

An EPROM: the Texas Instruments TMS27C040, a CMOS chip with 4 megabits of storage and 8-bit output (shown here in a 600-mil ceramic dual-in-line package). The TMS27C040 operates at 5 volts, but must be programmed at 13 volts.[1]

Early type of solid state computer memory

An EPROM (rarely EROM), or erasable programmable read-only memory, is a type of programmable read-only memory (PROM) chip that retains its data when its power supply is switched off. Computer memory that can retrieve stored data after a power supply has been turned off and back on is called non-volatile. It is an array of floating-gate transistors individually programmed by an electronic device that supplies higher voltages than those normally used in digital circuits. Once programmed, an EPROM can be erased by exposing it to strong ultraviolet light source (such as from a mercury-vapor lamp). EPROMs are easily recognizable by the transparent fused quartz (or on later models resin) window on the top of the package, through which the silicon chip is visible, and which permits exposure to ultraviolet light during erasing.[2]

Operation

Which type of memory chip can be erased only when it is removed from the computer and exposed to a special type of ultraviolet light?

An Intel 1702A EPROM, one of the earliest EPROM types (1971), 256 by 8 bit. The small quartz window admits UV light for erasure.

Development of the EPROM memory cell started with investigation of faulty integrated circuits where the gate connections of transistors had broken. Stored charge on these isolated gates changes their threshold voltage.

Following the invention of the MOSFET (metal-oxide-semiconductor field-effect transistor) by Mohamed Atalla and Dawon Kahng at Bell Labs, presented in 1960, Frank Wanlass studied MOSFET structures in the early 1960s. In 1963, he noted the movement of charge through oxide onto a gate. While he did not pursue it, this idea would later become the basis for EPROM technology.[3]

In 1967, Dawon Kahng and Simon Min Sze at Bell Labs proposed that the floating gate of a MOSFET could be used for the cell of a reprogrammable ROM (read-only memory).[4] Building on this concept, Dov Frohman of Intel invented EPROM in 1971,[4] and was awarded U.S. Patent 3,660,819 in 1972. Frohman designed the Intel 1702, a 2048-bit EPROM, which was announced by Intel in 1971.[4]

Each storage location of an EPROM consists of a single field-effect transistor. Each field-effect transistor consists of a channel in the semiconductor body of the device. Source and drain contacts are made to regions at the end of the channel. An insulating layer of oxide is grown over the channel, then a conductive (silicon or aluminum) gate electrode is deposited, and a further thick layer of oxide is deposited over the gate electrode. The floating-gate electrode has no connections to other parts of the integrated circuit and is completely insulated by the surrounding layers of oxide. A control gate electrode is deposited and further oxide covers it.[5]

To retrieve data from the EPROM, the address represented by the values at the address pins of the EPROM is decoded and used to connect one word (usually an 8-bit byte) of storage to the output buffer amplifiers. Each bit of the word is a 1 or 0, depending on the storage transistor being switched on or off, conducting or non-conducting.

Which type of memory chip can be erased only when it is removed from the computer and exposed to a special type of ultraviolet light?

A cross-section of a floating-gate transistor

The switching state of the field-effect transistor is controlled by the voltage on the control gate of the transistor. Presence of a voltage on this gate creates a conductive channel in the transistor, switching it on. In effect, the stored charge on the floating gate allows the threshold voltage of the transistor to be programmed.

Storing data in the memory requires selecting a given address and applying a higher voltage to the transistors. This creates an avalanche discharge of electrons, which have enough energy to pass through the insulating oxide layer and accumulate on the gate electrode. When the high voltage is removed, the electrons are trapped on the electrode.[6] Because of the high insulation value of the silicon oxide surrounding the gate, the stored charge cannot readily leak away and the data can be retained for decades.

The programming process is not electrically reversible. To erase the data stored in the array of transistors, ultraviolet light is directed onto the die. Photons of the UV light cause ionization within the silicon oxide, which allows the stored charge on the floating gate to dissipate. Since the whole memory array is exposed, all the memory is erased at the same time. The process takes several minutes for UV lamps of convenient sizes; sunlight would erase a chip in weeks, and indoor fluorescent lighting over several years.[7] Generally, the EPROMs must be removed from equipment to be erased, since it is not usually practical to build in a UV lamp to erase parts in-circuit. Electrically Erasable Programmable Read-Only Memory (EEPROM) was developed to provide an electrical erase function and has now mostly displaced ultraviolet-erased parts.

Details

Which type of memory chip can be erased only when it is removed from the computer and exposed to a special type of ultraviolet light?

Atmel AT27C010 - an OTP EPROM

As the quartz window is expensive to make, OTP (one-time programmable) chips were introduced; here, the die is mounted in an opaque package so it cannot be erased after programming – this also eliminates the need to test the erase function, further reducing cost. OTP versions of both EPROMs and EPROM-based microcontrollers are manufactured. However, OTP EPROM (whether separate or part of a larger chip) is being increasingly replaced by EEPROM for small sizes, where the cell cost isn't too important, and flash for larger sizes.

A programmed EPROM retains its data for a minimum of ten to twenty years,[8] with many still retaining data after 35 or more years, and can be read an unlimited number of times without affecting the lifetime. The erasing window must be kept covered with an opaque label to prevent accidental erasure by the UV found in sunlight or camera flashes. Old PC BIOS chips were often EPROMs, and the erasing window was often covered with an adhesive label containing the BIOS publisher's name, the BIOS revision, and a copyright notice. Often this label was foil-backed to ensure its opacity to UV.

Erasure of the EPROM begins to occur with wavelengths shorter than 400 nm. Exposure time for sunlight of one week or three years for room fluorescent lighting may cause erasure. The recommended erasure procedure is exposure to UV light at 253.7 nm of at least 15 Ws/cm2, usually achieved in 20 to 30 minutes with the lamp at a distance of about 2.5 cm.[9]

Erasure can also be accomplished with X-rays:

Erasure, however, has to be accomplished by non-electrical methods, since the gate electrode is not accessible electrically. Shining ultraviolet light on any part of an unpackaged device causes a photocurrent to flow from the floating gate back to the silicon substrate, thereby discharging the gate to its initial, uncharged condition (photoelectric effect). This method of erasure allows complete testing and correction of a complex memory array before the package is finally sealed. Once the package is sealed, information can still be erased by exposing it to X radiation in excess of 5*104 rads,[a] a dose which is easily attained with commercial X-ray generators.[10]

In other words, to erase your EPROM, you would first have to X-ray it and then put it in an oven at about 600 degrees Celsius (to anneal semiconductor alterations caused by the X-rays). The effects of this process on the reliability of the part would have required extensive testing so they decided on the window instead.[11]

EPROMs have a limited but large number of erase cycles; the silicon dioxide around the gates accumulates damage from each cycle, making the chip unreliable after several thousand cycles. EPROM programming is slow compared to other forms of memory. Because higher-density parts have little exposed oxide between the layers of interconnects and gate, ultraviolet erasing becomes less practical for very large memories. Even dust inside the package can prevent some cells from being erased.[12]

Application

For large volumes of parts (thousands of pieces or more), mask-programmed ROMs are the lowest cost devices to produce. However, these require many weeks lead time to make, since the artwork for an IC mask layer must be altered to store data on the ROMs. Initially, it was thought that the EPROM would be too expensive for mass production use and that it would be confined to development only. It was soon found that small-volume production was economical with EPROM parts, particularly when the advantage of rapid upgrades of firmware was considered.

Some microcontrollers, from before the era of EEPROMs and flash memory, use an on-chip EPROM to store their program. Such microcontrollers include some versions of the Intel 8048, the Freescale 68HC11, and the "C" versions of the PIC microcontroller. Like EPROM chips, such microcontrollers came in windowed (expensive) versions that were used for debugging and program development. The same chip came in (somewhat cheaper) opaque OTP packages for production. Leaving the die of such a chip exposed to light can also change behavior in unexpected ways when moving from a windowed part used for development to a non-windowed part for production.

EPROM generations, sizes and types

The first generation 1702 devices were fabricated with the p-MOS technology. They were powered with VCC = VBB = +5 V and VDD = VGG = -9 V in Read mode, and with VDD = VGG = -47 V in Programming mode.[13][14]

The second generation 2704/2708 devices switched to n-MOS technology and to three-rail VCC = +5 V, VBB = -5 V, VDD = +12 V power supply with VPP = 12 V and a +25 V pulse in Programming mode.

The n-MOS technology evolution introduced single-rail VCC = +5 V power supply and single VPP = +25 V[15] programming voltage without pulse in the third generation. The unneeded VBB and VDD pins were reused for additional address bits allowing larger capacities (2716/2732) in the same 24-pin package, and even larger capacities with larger packages. Later the decreased cost of the CMOS technology allowed the same devices to be fabricated using it, adding the letter "C" to the device numbers (27xx(x) are n-MOS and 27Cxx(x) are CMOS).

While parts of the same size from different manufacturers are compatible in read mode, different manufacturers added different and sometimes multiple programming modes leading to subtle differences in the programming process. This prompted larger capacity devices to introduce a "signature mode", allowing the manufacturer and device to be identified by the EPROM programmer. It was implemented by forcing +12 V on pin A9 and reading out two bytes of data. However, as this was not universal, programmer software also would allow manual setting of the manufacturer and device type of the chip to ensure proper programming.[16]

EPROM Type Year Size — bits Size — bytes Length (hex) Last address (hex) Technology
1702, 1702A 1971 2 Kbit 256 100 FF PMOS
2704 1975 4 Kbit 512 200 1FF NMOS
2708 1975 8 Kbit 1 KB 400 3FF NMOS
2716, 27C16, TMS2716, 2516 1977 16 Kbit 2 KB 800 7FF NMOS/CMOS
2732, 27C32, 2532 1979 32 Kbit 4 KB 1000 FFF NMOS/CMOS
2764, 27C64, 2564 64 Kbit 8 KB 2000 1FFF NMOS/CMOS
27128, 27C128 128 Kbit 16 KB 4000 3FFF NMOS/CMOS
27256, 27C256 256 Kbit 32 KB 8000 7FFF NMOS/CMOS
27512, 27C512 512 Kbit 64 KB 10000 FFFF NMOS/CMOS
27C010, 27C100 1 Mbit 128 KB 20000 1FFFF CMOS
27C020 2 Mbit 256 KB 40000 3FFFF CMOS
27C040, 27C400, 27C4001 4 Mbit 512 KB 80000 7FFFF CMOS
27C080 8 Mbit 1 MB 100000 FFFFF CMOS
27C160 16 Mbit 2 MB 200000 1FFFFF CMOS
27C320, 27C322 32 Mbit 4 MB 400000 3FFFFF CMOS

Gallery

See also

  • Programmable ROM
  • EEPROM
  • Flash memory
  • Intel HEX - File format
  • SREC - File format
  • Programmer (hardware)

Notes

  1. ^ 500 J/kg

References

  1. ^ Texas Instruments (1997), TMS27C040 524,288 BY 8-BIT UV ERASABLE TMS27PC040 524,288 BY 8-BIT PROGRAMMABLE READ-ONLY MEMORY
  2. ^ "CPU History - EPROMs". www.cpushack.com. Retrieved 2021-05-12.
  3. ^ "People". The Silicon Engine. Computer History Museum. Retrieved 17 August 2019.
  4. ^ a b c "1971: Reusable semiconductor ROM introduced". Computer History Museum. Retrieved 19 June 2019.
  5. ^ Sah 1991, p. 639.
  6. ^ Oklobdzija, Vojin G. (2008). Digital Design and Fabrication. CRC Press. pp. 5–17. ISBN 978-0-8493-8602-2.
  7. ^ Ayers, John E (2004), Digital integrated circuits: analysis and design, CRC Press, p. 591, ISBN 0-8493-1951-X.
  8. ^ Horowitz, Paul; Hill, Winfield (1989), The Art of Electronics (2nd ed.), Cambridge: Cambridge University Press, p. 817, ISBN 0-521-37095-7.
  9. ^ "M27C512 Datasheet" (PDF). Archived (PDF) from the original on 2018-09-06. Retrieved 2018-10-07.
  10. ^ Frohman, Dov (May 10, 1971), Electronics Magazine (article).
  11. ^ Margolin, J (May 8, 2009). "EPROM"..
  12. ^ Sah 1991, p. 640.
  13. ^ Intel 1702A 2K (256 x 8) UV Erasable PROM
  14. ^ AMD Am1702A 256-Word by 8-Bit Programmable Read Only Memory
  15. ^ "16K (2K x 8) UV ERASABLE PROM" (PDF). amigan.yatho.com. Intel. Retrieved 18 April 2020.
  16. ^ U.S. International Trade Commission, ed. (October 1998). Certain EPROM, EEPROM, Flash Memory and Flash Microcontroller Semiconductor Devices and Products Containing Same, Inv. 337-TA-395. Diane Publishing. pp. 51–72. ISBN 1-4289-5721-9. The details of SEEQ's Silicon Signature method of a device programmer reading an EPROM's ID.

Bibliography

  • Sah, Chih-Tang (1991), Fundamentals of solid-state electronics, World Scientific, ISBN 981-02-0637-2
Which type of memory chip can be erased only when it is removed from the computer and exposed to a special type of ultraviolet light?

  • Intel EPROM datasheets - intel-vintage.info
  • 1976 Intel Data Book, includes 1702, 2704, 2708 datasheets - archive.org
  • Detailed information about EPROM types and EPROM programming
  • Video of the Intel 1702 EPROM

Retrieved from "https://en.wikipedia.org/w/index.php?title=EPROM&oldid=1084269190"


Page 2

Pseudo-static random-access memory technology introduced by MoSys Inc.

1T-SRAM is a pseudo-static random-access memory (PSRAM) technology introduced by MoSys, Inc., which offers a high-density alternative to traditional static random-access memory (SRAM) in embedded memory applications. Mosys uses a single-transistor storage cell (bit cell) like dynamic random-access memory (DRAM), but surrounds the bit cell with control circuitry that makes the memory functionally equivalent to SRAM (the controller hides all DRAM-specific operations such as precharging and refresh). 1T-SRAM (and PSRAM in general) has a standard single-cycle SRAM interface and appears to the surrounding logic just as an SRAM would.

Due to its one-transistor bit cell, 1T-SRAM is smaller than conventional (six-transistor, or "6T") SRAM, and closer in size and density to embedded DRAM (eDRAM). At the same time, 1T-SRAM has performance comparable to SRAM at multi-megabit densities, uses less power than eDRAM and is manufactured in a standard CMOS logic process like conventional SRAM.

MoSys markets 1T-SRAM as physical IP for embedded (on-die) use in System-on-a-chip (SOC) applications. It is available on a variety of foundry processes, including Chartered, SMIC, TSMC, and UMC. Some engineers use the terms 1T-SRAM and "embedded DRAM" interchangeably, as some foundries provide MoSys's 1T-SRAM as "eDRAM". However, other foundries provide 1T-SRAM as a distinct offering.

Technology

1T SRAM is built as an array of small banks (typically 128 rows × 256 bits/row, 32 kilobits in total) coupled to a bank-sized SRAM cache and an intelligent controller. Although space-inefficient compared to regular DRAM, the short word lines allow much higher speeds, so the array can do a full sense and precharge (RAS cycle) per access, providing high-speed random access. Each access is to one bank, allowing unused banks to be refreshed at the same time. Additionally, each row read out of the active bank is copied to the bank-sized SRAM cache. In the event of repeated accesses to one bank, which would not allow time for refresh cycles, there are two options: either the accesses are all to different rows, in which case all rows will be refreshed automatically, or some rows are accessed repeatedly. In the latter case, the cache provides the data and allows time for an unused row of the active bank to be refreshed.

There have been four generations of 1T-SRAM:

Original 1T-SRAM About half the size of 6T-SRAM, less than half the power. 1T-SRAM-M Variant with lower standby power consumption, for applications such as cell phones. 1T-SRAM-R Incorporates ECC for lower soft error rates. To avoid an area penalty, it uses smaller bit cells, which have an inherently higher error rate, but the ECC more than makes up for that. 1T-SRAM-Q This "quad-density" version uses a slightly non-standard fabrication process to produce a smaller folded capacitor, allowing the memory size to be halved again over 1T-SRAM-R. This does add slightly to wafer production costs, but does not interfere with logic transistor fabrication the way conventional DRAM capacitor construction does.

Comparison with other embedded memory technologies

1T-SRAM has speed comparable to 6T-SRAM (at multi-megabit densities). It is significantly faster speed than eDRAM, and the "quad-density" variant is only slightly larger (10–15% is claimed). On most foundry processes, designs with eDRAM require additional (and costly) masks and processing steps, offsetting the cost of a larger 1T-SRAM die. Also, some of those steps require very high temperatures and must take place after the logic transistors are formed, possibly damaging them.

1T-SRAM is also available in device (IC) form. The Nintendo GameCube was the first video game system to use 1T-SRAM as a primary (main) memory storage; the GameCube possesses several dedicated 1T-SRAM devices. 1T-SRAM is also used in the successor to the GameCube, Nintendo's Wii console.

Note that this is not the same as 1T DRAM, which is a "capacitorless" DRAM cell built using the parasitic channel capacitor of SOI transistors rather than a discrete capacitor.

MoSys claims the following sizes for 1T-SRAM arrays:

1T-SRAM Cell sizes (μm²/bit or mm²/Mbit)
Process node 250 nm 180 nm 130 nm 90 nm 65 nm 45 nm
6T-SRAM bit cell 7.56 4.65 2.43 1.36 0.71 0.34
with overhead 11.28 7.18 3.73 2.09 1.09 0.52
1T-SRAM bit cell 3.51 1.97 1.10 0.61 0.32 0.15
with overhead 7.0 3.6 1.9 1.1 0.57 0.28
1T-SRAM-Q bit cell 0.50 0.28 0.15 0.07
with overhead 1.05 0.55 0.29 0.14

See also

US Patent 7,146,454 "Hiding refresh in 1T-SRAM Architecture"* (by Cypress Semiconductor) describes a similar system for hiding DRAM refresh using an SRAM cache.

References

  • Glaskowsky, Peter N. (1999-09-13). "MoSys Explains 1T-SRAM Technology: Unique Architecture Hides Refresh, Makes DRAM Work Like SRAM" (PDF). Microprocessor Report. 13 (12). Retrieved 2007-10-06.
  • Jones, Mark-Eric (2003-10-14). 1T-SRAM-Q: Quad-Density Technology Reins in Spiraling Memory Requirements (PDF) (Report). MoSys, Inc. Retrieved 2007-10-06.
  • MoSys homepage
  • US Patent 6,256,248 shows the DRAM array at the heart of 1T-SRAM.
  • US Patent 6,487,135 uses the term "1T DRAM" to describe the innards of 1T-SRAM.
  • Youths, Techfor (2002-12-16). "1-T SRAM macros are preconfigured for fast integration in SoC designs". Archived from the original on 2019-07-20. Retrieved 2020-08-21.
  • Cataldo, Anthony (2002-12-16). "NEC, Mosys push bounds of embedded DRAM". EE Times. ISSN 0192-1541. Retrieved 2007-10-06.

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